 |
Technical Brochure
|
|
 |
OPI 3D Scanning Probe
The OPI 3D Scanning Probe performs ultra-precise measurement with a high degree of accuracy. It can be used to characterize a wide variety of precision mechanical, optical, and electronic parts.
The OPI 3D Scanning Probe’s true orthogonal motion makes it insensitive to the length or geometry of the gauging stylus enabling it to outperform other 3D probes. The extremely low contact force between the probe and the part allow sensitive surfaces to be measured without danger of marketing or damaging them. A configurable counter balance adjustment allows compensation for the styli mass.
The OPI 3D Scanning Probe is available in horizontal and vertical orientations.
Probe Features:
Monolithic box flexures provide robust linear motion along all three axes.
Typical probing force of .001 Newton.
Each axis has stiffness of 0.4 Newtons/mm.
Scan speed up to 25 mm/sec.
Accommodates interchangeable styli with an industry standard M2 x 0.4 thread. |